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Photoelectron Spectroscopy Product List and Ranking from 5 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Photoelectron Spectroscopy Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. シエンタ オミクロン Tokyo//Testing, Analysis and Measurement
  2. アルバック・ファイ 営業部 （国内・海外） Kanagawa//Testing, Analysis and Measurement
  3. イオンテクノセンター Osaka//Testing, Analysis and Measurement
  4. 4 セイコーフューチャークリエーション Chiba//Testing, Analysis and Measurement
  5. 4 コベルコ溶接テクノ Kanagawa//Ferrous/Non-ferrous metals
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Photoelectron Spectroscopy Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. HiPP-Lab (Environmentally Controlled X-ray Photoelectron Spectroscopy Analysis System) シエンタ オミクロン
  2. Dual X-ray Photoelectron Spectroscopy System 'PHI Quantes' アルバック・ファイ 営業部 （国内・海外）
  3. Case Studies on Depth Analysis of Multilayer Films by ESCA イオンテクノセンター
  4. <PDF Data Download Available> [XPS] Contamination Analysis of Polyimide Surfaces Using XPS セイコーフューチャークリエーション
  5. 4 X-ray photoelectron spectroscopy (XPS) analysis コベルコ溶接テクノ

Photoelectron Spectroscopy Product List

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Case Studies on Depth Analysis of Multilayer Films by ESCA

Case Studies on Depth Analysis of Multilayer Films by ESCA

Publication of depth analysis results of multilayer films using an electron spectroscopy for chemical analysis (ESCA) device!

This case study collection presents examples of depth analysis of multilayer films using the photoelectron spectroscopy device "ESCA" from Ion Tech Center Co., Ltd., which provides services such as ion implantation, film formation and analysis, and research and commercialization management. The results of analyzing a stacked film of silicon oxide and titanium oxide on a silicon substrate using ESCA (Quantum-2000) are included. [Overview of Publication] ■Analysis results of depth analysis of multilayer films using ESCA *For more details, please refer to the catalog or feel free to contact us.

  • Other contract services
  • Other services
  • others

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<PDF Data Download Available> [XPS] Contamination Analysis of Polyimide Surfaces Using XPS

<PDF Data Download Available> [XPS] Contamination Analysis of Polyimide Surfaces Using XPS

X-ray photoelectron spectroscopy (XPS) is ideal for analyzing surface contamination, discoloration, and other evaluations because it provides elemental information from the outermost surface of the sample (a few nm).

A defect occurred where the surface of the polyimide film became hydrophobic, but due to the depth of information obtained from SEM/EDX analysis, the specific elements present on the very surface could not be detected. Therefore, we conducted surface analysis using X-ray photoelectron spectroscopy (XPS), which is a surface-sensitive method. In this case, we will introduce "Surface Contamination Analysis of Polyimide by XPS." Please take a moment to read the PDF materials. Additionally, our company conducts various surface analyses including GD-OES and Auger, in addition to this WPS. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Contract Analysis
  • Other polymer materials
  • Surface treatment contract service

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HiPP-Lab (Environmentally Controlled X-ray Photoelectron Spectroscopy Analysis System)

HiPP-Lab (Environmentally Controlled X-ray Photoelectron Spectroscopy Analysis System)

XPS analysis equipment that enables measurements at atmospheric pressure levels!

The HiPP-Lab refers to an XPS analysis device that enables measurements at atmospheric pressure levels. By using a differential pumping system, it allows for sample measurements in an environment close to atmospheric pressure, making it a next-generation XPS device capable of measurements under environmental control that were previously unattainable. 【Applications】 XPS observation and measurement of samples under environmental control --- Below is an introduction in English. The HiPP-Lab brings together the world leading instrumentation for APPES: ●Outstanding performance APPES system with unchallenged energy, spatial and angular resolution ●Intelligent integration and automation ●State of the art HiPP-3 analyser: - Line mode imaging mode - Angular mode - Swift acceleration mode for increased intensity

  • Analytical Equipment and Devices

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X-ray photoelectron spectroscopy (XPS) analysis

X-ray photoelectron spectroscopy (XPS) analysis

Soft X-ray irradiation! Ideal for qualitative and semi-quantitative analysis of substrates and circuits using photoelectron spectroscopy!

"X-ray photoelectron spectroscopy (XPS) analysis" involves irradiating the sample surface with soft X-rays and measuring the binding energy of the emitted photoelectrons. It allows for the examination of the elements and composition of the sample (qualitative and semi-quantitative analysis) as well as the chemical states of the elements (state analysis). The information detected pertains to the extreme surface layer of the sample (a few nanometers), and by combining it with Ar ion sputtering, depth profiling measurements can also be conducted. Since the excitation source is soft X-rays, it is possible to measure samples that are non-conductive. [Applicable Targets] ■ Metals in general ■ Ceramics ■ Semiconductors ■ Thin films ■ Films *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices

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Dual X-ray Photoelectron Spectroscopy System 'PHI Quantes'

Dual X-ray Photoelectron Spectroscopy System 'PHI Quantes'

XPS opens up new application areas that go beyond conventional wisdom!

The "PHI Quantes" is a scanning dual X-ray photoelectron spectroscopy (XPS) device equipped with two X-ray sources: hard X-rays (Cr Kα line) with different energy levels and conventional soft X-rays (Al Kα line), enabling high-sensitivity analysis from micro-regions to large areas. The two types of X-ray sources can be switched automatically in a short time, allowing analysis of the same location on the sample. 【Features】 ■ Scanning dual monochromator X-ray source ■ Easy measurement of the same area with two sources ■ Turnkey charge neutralization ■ Automatic analysis ■ High-voltage resistant analyzer *For more details, please download the PDF or feel free to contact us.

  • Spectroscopic Analysis Equipment

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